| File Type | Title | Author | Publish Date |
PDF
|
8 Hints for Better Millimeter-Wave Spectrum Measurements
This application note is primarily concerned with measurements made in coaxial environments by millimeter-wave spectrum analyzers to 50 GHz.
| Agilent |
4/1/2002
|
PDF
|
8 Hints for Making Better Spectrum Analyzer Measurements
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.
| Agilent |
9/7/2009
|
PDF
|
Combining Network and Spectrum Analyses and IBASIC
Active components (and now even some passive components like crystal filters require analysis to characterize linear parameters (gain/loss, phase and group delay or S-parameters) as well as non-linear performance.
| Agilent |
8/30/2001
|
PDF
|
Comparing Power Measurements on Digitally Modulated Signals
| Agilent |
9/1/2000
|
PDF
|
Fundamentals of Signal Analysis
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers.
| Agilent |
6/1/2000
|
PDF
|
Fundamentals of Signal Analysis Series (AN 1405-1)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains.
| Agilent |
5/24/2002
|
PDF
|
Fundamentals of Signal Analysis Series (AN 1405-2)
This application note is a primerfor those who are unfamiliar with the class of analyzers we call dynamic signal analyzers. These instruments are particularly appropriate for the analysis of signals in the range of a few millihertz to about a hundred kilohertz.
| Agilent |
8/6/2002
|
PDF
|
Noise Figure Measurement Accuracy: The Y-Factor Method
This Application Note explains the fundamentals of noise figure, the Y-Factor measurement, as well as focusing on such important issues as errors and mismatch uncertainty
| Agilent |
5/5/2010
|
PDF
|
Optimizing Dynamic Range for Distortion Measurements
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.
| Agilent |
1/12/2009
|
PDF
|
Optimizing Spectrum Analyzer Amplitude Accuracy
This Application Note covers the factors affecting the accuracy (or uncertainty) of amplitude measurements made with spectrum analyzers, and explains how to calculate worst-case uncertainty in general situations.
| Agilent |
8/1/2000
|
PDF
|
Optimizing Spectrum Analyzer Measurement Speed
Whether you are installing a new, high-speed production line, making transmitter measurements in the field, or designing a new low-noise amplifier, the speed of your spectrum analyzer will greatly affect your productivity.
| Agilent |
5/1/2000
|
PDF
|
PDC and NADC Transmitter Measurement for Base Transceiver Stations and Mobile Stations
This Application Note describes the key RF parametric measurements necessary to characterize Personal Digital Cellular (PDC) and North American Digital Cellular (NAD) transmitters in both Base Transceiver Stations (BTS) and Mobile Stations (MS).
| Agilent |
2/1/2000
|
PDF
|
Performance Spectrum Analyzer Series: Swept and FFT Analysis Application Note
This Product Note covers the measurement speed and other benefits of advanced signal processing in the new PSA Performance Spectrum Analyzer Series.
| Agilent |
10/19/2004
|
PDF
|
RF Handheld Testers Guarantee Traffic Stability Under Olympic-Sized Stress Conditions
| Agilent |
9/2/2008
|
PDF
|
RF Testing of Wireless LAN Products Application Note
This Application Note discusses the modulation technology behind several wireless LAN standards and the measurement techniques that can be used to trouble shoot and quantify their RF performance.
| Agilent |
1/10/2007
|
PDF
|
Spectrum Analysis Basics: From 1997 Back to Basics Seminar
This paper covers everything from a definition of spectrum to the types of instruments used to make the measurements. Topics include resolution, amplitude measurements sensitivity, dynamic range, LO stability, and the use of spectrum analyzers....
| Agilent |
4/1/2007
|
PDF
|
Spectrum Analyzer Basics
| Agilent |
8/2/2006
|
PDF
|
Spectrum Analyzer Measurements and Noise
Noise. It is the classical limitation of electronics. In measurements, noise and distortions limit the dynamic range of test results.
| Agilent |
9/16/2009
|
PDF
|
Testing and Troubleshooting Digital RF Communications Transmitter Designs
This Application Note covers the following 3 topics: 1) How digital communications transmitters work, 2) Essential transmitter tests and important test equipment characteristics, and 3) Troubleshooting techniques for common impairments.
| Agilent |
1/8/2002
|
PDF
|
The Application of Handheld Spectrum Analyzers in Interference Testing
| Agilent |
5/19/2008
|
PDF
|
Understanding CDMA Measurements for Base Stations and Their Components
This Application Note presents the fundamental measurement principles for the RF parametric tests performed on Code Division Multiple Access (CDMA) base stations and their components.
| Agilent |
6/1/2000
|
PDF
|
Understanding GSM/EDGE Transmitter and Receiver Measurements for Base Transceiver Stations
This 36-page application note presents the fundamental RF parametric measurements necessary to characterize GSM/EDGE base transceiver stations and their components.
| Agilent |
8/24/2002
|
PDF
|
Using Extended Calibration Software for Wide Bandwidth Measurements
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.
| Agilent |
5/22/2008
|