Features and Specifications of the Keysight / Agilent 4156C Analyzer include:

• High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1microV to 200 V
• Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
• Synchronized stress/measure function, two high-voltage pulse generator units (40 V)
• Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
• Automation: built-in HP Instrument BASIC, trigger I/O capability
• Four built-in high-resolution source /monitor units, 2-voltage source units; 2-voltage monitor units
• Develops new process technologies and evaluates materials with measurements to 1 fA and 0.2 uV
• Full Kelvin; force, sense, and guard terminals for each HRSMU
• Performs quasi-static capacitance measurements versus voltage measurements
• Automatically extracts process parameters without manually manipulating screen markers
• Measures leakage characteristics with ultra-low leakage SMUs
• Automates device characterization with integrated pulse generators and selector switches
• Performs on-wafer reliability tests with built-in stressing modes
• Performs point-and-click measurements with graphical user interface
• Provides graphical data analysis capabilities with a Windows environment
• Knob sweep function verifies each probe is making contact
• Stand-by mode eliminating need for external power supplies
• Triggering modes allow synchronized AC/DC measurements
• IBASIC user functions that allows all data to be plotted and analyzed

Description

The Keysight / Agilent 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the Keysight / Agilent 4156C Analyzer provide a firm foundation for future expansion with other measurement instruments.